2025-08-02 / 芯片半导体 / 47 浏览 GaN-HEMT Dynamic ON-state Resistance characterisation and Modelling GaN-HEMT Dynamic ON-state Resistance characterisation and Modelling下载 相关文章 Gate leakage reduction in AlGaN/GaN HEMTs using in situi on treatment 2025-08-05 Nonlinear Capacitance Compensation Method for Integrating a Metal–Semiconductor–Metal Varactor with a Gallium Nitride High Electron Mobility Transistor Power Amplifier 2025-08-05 Threshold Voltage Improvement and Leakage Reduction of AlGaN/GaN HEMTs Using Dual-Layer SiNx Stressors 2025-08-05 Reduced surface leakage current and trapping effects in AlGaN/GaN high electron mobility transistors on silicon with SiN/Al2O3 passivation 2025-08-05 Development of GaN HEMTs Fabricated on Silicon,Silicon-on-Insulator, and Engineered Substrates and the Heterogeneous Integration 2025-08-05 Impacts of Backside Insulation on the Dynamic On- Resistance of Lateral p-GaN HEMTs-on-Si 2025-08-02 0 This post has no comment yet 发表回复 取消回复您的邮箱地址不会被公开。 必填项已用 * 标注评论 * 显示名称 * 邮箱 * 网站 在此浏览器中保存我的显示名称、邮箱地址和网站地址,以便下次评论时使用。 上一篇 Impacts of Backside Insulation on the Dynamic On- Resistance of Lateral p-GaN HEMTs-on-Si 下一篇 Development of GaN HEMTs Fabricated on Silicon,Silicon-on-Insulator, and Engineered Substrates and the Heterogeneous Integration
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